Thin Film Evaluation Device "Spectroscopic Ellipsometer"
[Demo available] Evaluation of the composition ratio of compound semiconductor materials is also possible! Accurately measure the thickness of thin films, including epitaxial films, non-contact and non-destructively.
The "spectroscopic ellipsometer" is a thin film evaluation device that accurately measures the thickness, refractive index, and extinction coefficient of thin films, including epitaxial films, in a non-contact and non-destructive manner. It is also capable of evaluating the composition ratios of compound semiconductor materials. The main evaluation and measurement items are the "thickness of thin films," "epitaxial film thickness," "refractive index," "extinction coefficient," "composition ratio of compound semiconductors," and "dopant concentration." 【Main Evaluation and Measurement Items】 ■ Thickness of thin films ■ Epitaxial film thickness ■ Refractive index, extinction coefficient ■ Composition ratio of compound semiconductors ■ Dopant concentration Please feel free to contact us for information on the specifications and pricing of the device. *Demonstrations are also possible. If you wish to request a demonstration, please indicate "Request for Demo" using the contact button below.
- Company：日本セミラボ 新横浜本社
- Price：Other
